منابع مشابه
MEMS, Microengineering and Aerospace Systems
Microelectronics processing technology spawned a new area of science and engineering exemplified by the acronyms MEMS (microelectromechanical systems) and NEMS (nanoelectromechanical systems). Microengineering is a multidisciplinary investigation of the physics and science of the submillimeter scale world and the application of this understanding to develop mass-producible microdevices and syst...
متن کاملAerospace Cyber-Physical Systems Education
Modern Aerospace systems are cyber-physical, comprised of physical components but commanded and controlled by “cyber” (computing and communication) elements. It is widely acknowledged that codesign across cyber and physical elements will provide a better-performing holistic system, but few of today’s engineers have adequate preparation to model, optimize, and simulate both. Even working in team...
متن کاملTowards Trustworthy Aerospace Systems: An Experience Report
Building modern aerospace systems is highly demanding. They should be extremely dependable. They must offer service without interruption (i.e., without failure) for a very long time — typically years or decades. Whereas ”five nines” dependability, i.e., a 99.999 % availability, is satisfactory for most safety-critical systems, for on-board systems it is not. Faults are costly and may severly da...
متن کاملMulti-modal Computational Aerospace Systems Simulation
This report describes the progress made in the first year (Sept. 1, 1999 LO Aug. 3 1,2000) of work at The University of Toledo under the NASA Information Technology (IT) Program grant number NAG-1-2244. This research is aimed at developing a neiv and advanced simulation framework that will significantly improve the overall efficiency of aerospace systems design and development. This objective w...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: JOURNAL OF THE JAPAN WELDING SOCIETY
سال: 2012
ISSN: 0021-4787,1883-7204
DOI: 10.2207/jjws.81.173